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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">mateltech</journal-id><journal-title-group><journal-title xml:lang="ru">Известия высших учебных заведений. Материалы электронной техники</journal-title><trans-title-group xml:lang="en"><trans-title>Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1609-3577</issn><issn pub-type="epub">2413-6387</issn><publisher><publisher-name>MISIS</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17073/1609-3577-2019-2-135-142</article-id><article-id custom-type="elpub" pub-id-type="custom">mateltech-325</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Атомные структуры и методы структурных исследований</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ATOMIC STRUCTURES AND METHODS OF STRUCTURAL INVESTIGATIONS</subject></subj-group></article-categories><title-group><article-title>Оценка степени кристаллографического упорядочения магнитоактивных ионов в Sr2FeMoO6-δ с помощью интенсивности рентгеновского пика (101)</article-title><trans-title-group xml:lang="en"><trans-title>Estimation of the degree of crystallographic ordering of magnetoactive ions in Sr2FeMoO6-δ by means of the intensity of the X-ray peak (101)</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-2615-6882</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Артюх</surname><given-names>Е.</given-names></name><name name-style="western" xml:lang="en"><surname>Artsiukh</surname><given-names>E.</given-names></name></name-alternatives><bio xml:lang="ru"><p>ул. П. Бровки, д. 19, Минск, 220072</p><p>Артюх Евгений</p></bio><bio xml:lang="en"><p>19 P. Brovki Str. Minsk 220072</p><p>Evgenij Artsiukh</p></bio><email xlink:type="simple">sirfranzferdinand@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-9440-2232</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Суханек</surname><given-names>Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Suchaneck</surname><given-names>G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>01062 Дрезден</p><p>Суханек Гуннар</p></bio><bio xml:lang="en"><p>01062 Dresden</p><p>Dr. Gunnar Suchaneck</p></bio><email xlink:type="simple">Gunnar.Suchaneck@mailbox.tu-dresden.de</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>ГО «НПЦ НАН Беларуси по материаловедению»</institution><country>Беларусь</country></aff><aff xml:lang="en"><institution>SSPA «Scientific-Practical Materials Research Centre of NAS of Belarus»</institution><country>Belarus</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>TU Dresden, Лаборатория твердотельной электроники</institution><country>Германия</country></aff><aff xml:lang="en"><institution>TU Dresden, Solid State Electronics Laboratory</institution><country>Germany</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2019</year></pub-date><pub-date pub-type="epub"><day>04</day><month>12</month><year>2019</year></pub-date><volume>22</volume><issue>2</issue><fpage>135</fpage><lpage>142</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Артюх Е., Суханек Г., 2019</copyright-statement><copyright-year>2019</copyright-year><copyright-holder xml:lang="ru">Артюх Е., Суханек Г.</copyright-holder><copyright-holder xml:lang="en">Artsiukh E., Suchaneck G.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://met.misis.ru/jour/article/view/325">https://met.misis.ru/jour/article/view/325</self-uri><abstract><p>Ферромолибдат стронция (Sr2FeMoO6-d, SFMO), обладающий структурой двойного перовскита, является многообещающим кандидатом для использования в качестве основного материала в спинтронике. Однако на данный момент SFMO не нашел широкого применения из-за низкой воспроизводимости его магнитных свойств, вызванной, в том числе, их сильной зависимостью от степени упорядочения катионов Fe и Mo в подрешетках B´ и B² двойного перовскита A2B´B²O6. Рассмотрен экспресс-метод определения степени разупорядочения ферромолибдата стронция. Степень заселения подрешеток катионами Fe и Mo определена как для стехиометрического, так и для нестехиометрического Sr2FeMoO6-δ с 5%-ным избытком Fe и Mo соответственно. Рассчитано соотношение интенсивности пикa сверхструктурного упорядочения (101) к наиболее интенсивному пику (112 + 200). Проведена подгонка расчетных кривых под известное для аналогичных случаев аналитическое выражение. Результаты расчетов предложенным авторами методом совпадают с результатами обработки экспериментальных данных методом Ритвельда в пределах ±25 %, что позволяет использовать этот метод в качестве альтернативы методу Ритвельда в том случае, когда время выдержки для рентгеноструктурного анализа установлено недостаточно большим. Обсуждено влияние таких факторов, как приборное уширение дифракционных пиков, уширение пиков вследствие уменьшения размера кристаллитов, изменение параметров решетки тонких пленок за счет их несоответствия с подложкой и изменение параметров решетки за счет появления кислородных вакансий на соотношение интенсивности пиков I(101)/I(112 + 200). Актуальность метода состоит в том, что он позволяет оценить степень сверхструктурного упорядочения Sr2FeMoO6-d не требуя больших затрат времени съемки и обработки данных дифрактограмм методом Ритвельда, что может быть полезно в случае, когда предстоит обработать большое количество результатов измерений.</p></abstract><trans-abstract xml:lang="en"><p>Strontium ferromolybdate (Sr2FeMoO6-δ, SFMO) having a double Perovskite structure shows good promise as a basic material for spintronics. However SFMO has not yet found wide application due to the low reproducibility of its magnetic properties which partially originates from their strong dependence on the ordering degree of Fe and Mo ions in the B´ and B² sublattices of double perovskite A2B´B²O6. We have considered a rapid method of determining strontium ferromolybdate disorder degree. Sublattice population with Fe and Mo ions has been estimated for stoichiometric and nonstoichiometric Sr2FeMoO6-δ with a 5% Fe and Mo excess, respectively. We have calculated the intensity ratio between the superstructural ordering (101) peak and the most intense (112 + 200) peak. The calculated curves have been fitted to the analytical expression for similar cases known from literature. The calculation results obtained using this method are in agreement with the results of experimental data processing using the Rietveld method accurate to within ±25 %. Thus this method can be used instead of the Rietveld method if the exposure time set in an X-ray diffraction experiment is insufficient. We have discussed the dependence of the I(101)/I(112 + 200) peak intensity ratio on various factors including diffraction peak instrumental broadening, peak twinning due to grain size reduction, thin film lattice parameter variation due to substrate lattice mismatch and lattice parameter variation due to oxygen vacancies. The method is useful as it allows evaluating the superlattice ordering degree in Sr2FeMoO6-d without large time consumption for X-ray diffraction pattern recording and processing with the Rietveld method which may be essential when dealing with large amounts of experimental data</p></trans-abstract><kwd-group xml:lang="ru"><kwd>ферромолибдат стронция</kwd><kwd>степень упорядоченности атомов</kwd><kwd>рентгеноструктурный анализ</kwd></kwd-group><kwd-group xml:lang="en"><kwd>strontium ferromolybdate</kwd><kwd>atomic ordering degree</kwd><kwd>X-ray structural analysis</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при финансовой поддержке Европейского союза в рамках программы Horizon 2020, H2020-MSCA-RISE-2017 (соглашение по гранту № 778308 SPINMULTIFILM).</funding-statement><funding-statement xml:lang="en">The work was financially supported by the European Union within the Horizon 2020, H2020-MSCA-RISE-2017 Program (Grant No. 778308 SPINMULTIFILM).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Serrate D., De Teresa J. 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