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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">mateltech</journal-id><journal-title-group><journal-title xml:lang="ru">Известия высших учебных заведений. Материалы электронной техники</journal-title><trans-title-group xml:lang="en"><trans-title>Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1609-3577</issn><issn pub-type="epub">2413-6387</issn><publisher><publisher-name>MISIS</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17073/1609-3577-2020-2-142-150</article-id><article-id custom-type="elpub" pub-id-type="custom">mateltech-351</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Физические свойства и методы исследования</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>PHYSICAL CHARACTERISTICS AND THEIR STUDY</subject></subj-group></article-categories><title-group><article-title>Влияние самоорганизации поверхностного заряда на затворно-индуцированные электронную и дырочную двумерные системы</article-title><trans-title-group xml:lang="en"><trans-title>The effect of surface charge self-organization on gate-induced electron  and hole two-dimensional systems</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ткаченко</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Tkachenko</surname><given-names>V. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>просп. Академика Лаврентьева, д. 13, Новосибирск, 630090;</p><p>ул. Пирогова, д. 1, Новосибирск, 630090</p><p>Ткаченко Виталий Анатольевич — канд. физ.-мат. наук, старший научный сотрудник</p></bio><bio xml:lang="en"><p>Akad. Lavrent’eva Ave., 13, Novosibirsk, 630090;</p><p>Pirogova Str., 1, Novosibirsk, 630090</p><p>Vitaly A. Tkachenko: Cand. Sci. (Phys.-Math.), Senior Scientist</p></bio><email xlink:type="simple">vtkach@isp.nsc.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ткаченко</surname><given-names>О. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Tkachenko</surname><given-names>O. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>просп. Академика Лаврентьева, д. 13, Новосибирск, 630090</p><p>Ткаченко Ольга Александровна — канд. физ.-мат. наук, старший научный сотрудник</p></bio><bio xml:lang="en"><p>Akad. Lavrent’eva Ave., 13, Novosibirsk, 630090</p><p>Olga A. Tkachenko: Cand. Sci. (Phys.-Math.), Senior Scientist</p></bio><email xlink:type="simple">otkach@list.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Бакшеев</surname><given-names>Д. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Baksheev</surname><given-names>D. G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>ул. Пирогова, д. 1, Новосибирск, 630090</p><p>Бакшеев Дмитрий Георгиевич — канд. физ.-мат. наук, ассистент</p></bio><bio xml:lang="en"><p>Pirogova Str., 1, Novosibirsk, 630090</p><p>Dmitry G. Baksheev: Cand. Sci. (Phys.-Math.), Assistant Lecturer</p></bio><email xlink:type="simple">d.baksheev@g.nsu.ru</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Сушков</surname><given-names>О. П.</given-names></name><name name-style="western" xml:lang="en"><surname>Sushkov</surname><given-names>O. P.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Sydney, 2052</p><p>Сушков Олег Петрович — доктор физ.-мат. наук, профессор</p></bio><bio xml:lang="en"><p>Sydney, 2052</p><p>Oleg P. Sushkov: Dr. Sci. (Phys.-Math.), Full Professor</p></bio><xref ref-type="aff" rid="aff-4"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Институт физики полупроводников им. А. В. Ржанова СО РАН;&#13;
Новосибирский государственный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences;&#13;
Novosibirsk State University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Институт физики полупроводников им. А.В. Ржанова СО РАН</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Новосибирский государственный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Novosibirsk State University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-4"><aff xml:lang="ru"><institution>School of Physics, University of New South Wales</institution><country>Австралия</country></aff><aff xml:lang="en"><institution>University of New South Wales</institution><country>Australia</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>08</day><month>08</month><year>2020</year></pub-date><volume>23</volume><issue>2</issue><fpage>142</fpage><lpage>150</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ткаченко В.А., Ткаченко О.А., Бакшеев Д.Г., Сушков О.П., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Ткаченко В.А., Ткаченко О.А., Бакшеев Д.Г., Сушков О.П.</copyright-holder><copyright-holder xml:lang="en">Tkachenko V.A., Tkachenko O.A., Baksheev D.G., Sushkov O.P.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://met.misis.ru/jour/article/view/351">https://met.misis.ru/jour/article/view/351</self-uri><abstract><p>Предложена простая модель для описания самоорганизации локализованных зарядов и квантового рассеяния в нелегированных структурах GaAs/AlGaAs, в которых двумерный газ электронов, либо дырок создается соответствующим напряжением на затворе. Предполагается, что в такой структуре металл—диэлектрик—нелегированный полупроводник доминирует рассеяние носителей на локализованных поверхностных зарядах, которые могут находиться в любой точке плоскости, имитирующей интерфейс между GaAs и диэлектриком. Предложенная модель рассматривает эти поверхностные заряды и соответствующие заряды изображения в металлическом затворе как замкнутую систему в термостате. Электростатическая самоорганизация для данной системы в состояниях термодинамического равновесия исследована численно с помощью алгоритма Метрополиса в широком диапазоне температур. Показано, что при T &gt; 100 К простая формула, выведенная из теории двумерной однокомпонентной плазмы дает почти такое же поведение структурного фактора при малых волновых числах, как алгоритм Метрополиса. Времена рассеяния затворно-индуцированных носителей описываются формулами, в которых структурный фактор характеризует замороженный беспорядок в данной системе. В этих формулах определяющим является поведение структурного фактора при малых волновых числах. Расчет по этим формулам при беспорядке, отвечающем бесконечной T, дал в два-три раза меньшие времена рассеяния, чем в соответствующих экспериментах. Мы нашли, что теория согласуется с экспериментом при температуре замерзания беспорядка T ≈ 1000 К в случае образца с двумерным электронным газом и T ≈ 700 К для образца с двумерным дырочным газом. Найденные величины являются оценкой сверху температуры замерзания в изучаемых структурах, поскольку модель игнорирует другие источники беспорядка кроме температуры.</p></abstract><trans-abstract xml:lang="en"><p>A model is proposed for describing the self-organization of localized charges and quantum scattering in undoped GaAs/AlGaAs structures in which a two-dimensional gas of electrons or holes is created by the corresponding gate voltage. We assume that in such a metal-dielectric-undoped semiconductor structure carrier scattering on surface charges localized at the interface between GaAs and the dielectric dominates. Proposed model considers these charges and the corresponding image charges in the metal gate as a closed system in a thermostat. The electrostatic self-organization for this system in thermodynamic equilibrium is studied numerically using the Metropolis algorithm in a wide temperature range. It is shown that, at T &gt; 100 K, a simple formula derived from the theory of two-dimensional one-component plasma gives almost the same behavior of the structural factor at low wave numbers as the Monte Carlo calculation. The scattering times of gate-induced carriers are described by formulas in which the structural factor characterizes the frozen disorder in the given system. In these formulas, the behavior of the structural factor at small wave numbers is decisive. A calculation using these formulas with disorder corresponding to infinite T gives two to three times shorter scattering times than in the corresponding experiments. We found that the theory is consistent with experiment at a freezing point of disorder T ≈ 1000 K for a sample with a two-dimensional electron gas and T ≈ 700 K for a sample with a two-dimensional hole gas. The found values are an upper estimate of the freezing temperature in the studied structures, since the model ignores sources of disorder other than temperature.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>нелегированные структуры</kwd><kwd>затворно-индуцированные двумерные системы</kwd><kwd>поверхностный заряд</kwd><kwd>температура замораживания беспорядка</kwd></kwd-group><kwd-group xml:lang="en"><kwd>undoped structures</kwd><kwd>gate-induced two-dimensional systems</kwd><kwd>surface charge</kwd><kwd>disorder freezing temperature</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена в рамках гранта 19-72-30023 Российского научного фонда. Расчеты выполнялись с использованием вычислительных ресурсов МСЦ РАН. Мы благодарны сотрудникам университета Нового Южного Уэльса (Австралия)   A.R. Hamilton, O. Klochan и D.Q. Wang за возможность сравнения расчетов и теории с экспериментальными данными.</funding-statement><funding-statement xml:lang="en">This work was supported by Grant No. 19-72-30023 of the Russian Research Foundation. The calculations were carried out using computing resources of the Joint Supercomputer Center of the Russian Academy of Sciences under State Assignment No. 0306-2019-0011. We are grateful to colleagues A.R. Hamilton, O. Klochan and D.Q. Wang from the University of New South Wales, Australia, for the opportunity to compare calculations and theory with experimental data.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Cowley A. M., Sze S. M. Surface states and barrier height of metal-semiconductor systems // J. Appl. Phys. 1965. V. 36, Iss. 10. P. 3212—3220. DOI: 10.1063/1.1702952</mixed-citation><mixed-citation xml:lang="en">Cowley A. 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