Preview

Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering

Advanced search

PECULIARITY OF FORMING TRANSPARENT CONDUCTING FILMS ON BASIS OF OXIDES INDIUM-TIN FOR CONTACTS ON GAN-BASED LIGHT EMITTING DIODES

https://doi.org/10.17073/1609-3577-2013-2-60-64

Abstract

ITO thin films were prepared by electron beam deposition method over a range of processing conditions. The target material used in this study was an ITO pellet with a composition: In2O3 90 wt% and SnO2 10 wt%. The evaporation conditions were: a vacuum of 5 × 10-4 or 4 × 10-2 Pa and the rate of evaporation were controlled within the range 0.075–0.4 nm/s. The thickness of thin film was controlled by using a quartz crystal thickness monitor, resulting in films having 200 nm. After the deposition, the samples were annealed in a thermal annealing furnace in air or nitrogen at 300-700 оC for 30 s. Experiments aimed at choosing the optimal atmosphere for annealing the films yielded the different results. Indium tin oxide coatings properties were researching as a function of the deposition atmosphere and conditions of a thermal annealing. The ITO films deposited and annealed under the optimized conditions work well as the transparent conducting electrode in the light emitting diodes based on GaN.

About the Authors

K. D. Vanyukhin
National Research Nuclear University «MEPhI»
Russian Federation


R. V. Zakharchenko
National Research Nuclear University «MEPhI»
Russian Federation


N. I. Kargin
National Research Nuclear University «MEPhI»
Russian Federation


L. A. Seidman
National Research Nuclear University «MEPhI»
Russian Federation


References

1. Марков, Л. К. Отражающий p-контакт на основе тонких пленок ITO для флип-чип-светодиодов AlGaInN / Л. К. Марков, И. П. Смирнова, А. С. Павлюченко, Е. М. Аракчеева, М. М. Кулагина // Физика и техника полупроводников. – 2009. – Т. 43, № 11. – С. 1564—1569.

2. Смирнова, И. П. AlGaInN−светодиоды с прозрачным p-контактом на основе тонких пленок ITO. / И. П. Смирнова, Л. К. Марков, А. С. Павлюченко, М. В. Кукушкин // Там же. – 2012. – Т. 46, № 3. – С. 384—388.

3. Kow-Ming Chang. Highly reliable GaN−based light−emitting diodes formed by p-In0,1Ga0,9N–ITO structure / Kow-Ming Chang, Jiunn-Yi Chu, Chao-Chen Cheng. // IEEE Photonics Technol. Lett. – 2004. – V. 16, N 8. – P. 1807—1809.

4. Kow-Ming Chang. Investigation of indium–tin-oxide ohmic contact to p-GaN and its application to high−brightness GaN-based light-emitting diodes. / Kow-Ming Chang, Jiunn-Yi Chu, Chao-Chen Cheng // Solid State Electron. – 2005. – V. 49. – P. 1381—1386.

5. Kim, D. W. A study of transparent indium tin oxide (ITO) contact to p-GaN / D. W. Kim, Y. J. Sung, J. W. Park, G. Y. Yeom // Thin Solid Films. – 2001. – V. 398 – 399. – P. 87—92.

6. Hou Wenting. Evaluation of metal/indium-tin-oxide for transparent low-resistance contacts to p-type GaN / Wenting Hou, Ch. Stark, Shi You, Liang Zhao, Theeradetch Detchprohm, Ch. Wetzel. // Appl. Optics. – 2012. – V. 51, N 23. – P. 5596—5600.

7. Куэй, Р. Электроника на основе нитрида галлия / Р. Куэй. – М. : Техносфера, 2011. – 587 с.

8. Morgan, D. V. Annealing effects on opto-electronic properties of sputtered and thermally evaporated indium-tin-oxide films / D. V. Morgan, Y. H. Aliyu. R. W. Bunco, A. Salehi // Thin Solid Films. – 1998. – V. 312. – P. 268—272.

9. Habibi, M. H. The effect of annealing on structural, optical and electrical properties of nanostructured tin doped indium oxide thin films / M. H. Habibi, N. Talebian // Acta Chim. Slov. – 2005. – V. 52. – P. 53—59.

10. Neubert, T. Investigations on oxygen diffusion in annealing processes of non-stoichiometric amorphous indium tin oxide thin films / T. Neubert, F. Neumann, K. Schiffmann, P. Willich, A. Hangleiter // Thin Solid Films. – 2006. – V. 513. – P. 319—324.

11. Paine, D. C. A study of low temperature crystallization of amorphous thin film indium—tin—oxide / D. C. Paine, T. Whitson, D. Janiac, R. Beresford, Cleva Ow Yang, B. Lewis // J. Appl. Phys. – 1999. – V. 85, N 12. – P. 8446—8450.

12. Zhu, F. Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy / F. Zhu, C. H. A. Huan, K. Zhang, A. T. S. Wee // Thin Solid Films. – 2000. V. 359. – P. 244—250.

13. Neng Wan. Indium tin oxide thin films for silicon-based electroluminescence devices prepared by electron beam evaporation method / Neng Wan, Tao Wang, Hongcheng Sun, Guran Chen, Lei Geng, Xinhui Gan, Sihua Guo, Jun Xu, Ling Xu, Kunji Chen // J. Non – Crystalline Solids. – 2010. – V. 356. – P. 911—916.

14. Sonia Alves Cardoso Diniz, A. The effects of various annealing regimes on the microstructure and physical properties of ITO (In2O3 : Sn) thin films deposited by electron beam evaporation for solar energy applications / A. Sonia Alves Cardoso Diniz // Renewable Energy. – 2011. – V. 36. – P. 1153—1165.

15. Belo, G. S. A simplified reactive thermal evaporation method for indium tin oxide electrodes / G. S. Belo, B. J. P. da Silva, E. A. de Vasconcelos, W. M. de Azevedo, E. F. da Silva Jr. // Appl. Surface Sci. – 2008. – V. 255. – P. 755—757.

16. Raoufi, D. Multifractal analysis of ITO thin films prepared by electron beam deposition method / D. Raoufi, H. R. Fallah, A. Kiasatpour, A. S. H. Rozatian // Appl. Surface Sci. – 2008. – V. 254. – P. 2168—2173.

17. George, J. Electrical and optical properties of electron beam evaporated ITO thin films / J. George, C. S. Menon // Surface and Coatings Technol. – 2000. – V. 132. – P. 45—48.


Review

For citations:


Vanyukhin K.D., Zakharchenko R.V., Kargin N.I., Seidman L.A. PECULIARITY OF FORMING TRANSPARENT CONDUCTING FILMS ON BASIS OF OXIDES INDIUM-TIN FOR CONTACTS ON GAN-BASED LIGHT EMITTING DIODES. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2013;(2):60-64. (In Russ.) https://doi.org/10.17073/1609-3577-2013-2-60-64

Views: 955


Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.


ISSN 1609-3577 (Print)
ISSN 2413-6387 (Online)