For citations:
Aleshin A.N., Zenchenko N.V., Ruban O.A. Simulation of TiN/HfO2/Pt memristor I–V curve for different conductive filament thickness. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2021;24(2):79-87. (In Russ.) https://doi.org/10.17073/1609-3577-2021-2-79-87
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