Failure-tolerant synchronous and self-timed circuits comparison
https://doi.org/10.17073/1609-3577-2021-4-229-233
Abstract
The article considers the problem of developing synchronous and self-timed (ST) digital circuits that are tolerant to soft errors. Synchronous circuits traditionally use the 2-of-3 voting principle to ensure single failure, resulting in three times the hardware costs. In ST circuits, due to dual-rail signal coding and two-phase control, even duplication provides a soft error tolerance level 2.1 to 3.5 times higher than the triple modular redundant synchronous counterpart. The development of new high-precision software simulating microelectronic failure mechanisms will provide more accurate estimates for the electronic circuits’ failure tolerance.
Keywords
synchronouscircuit,
self-timedcircuit,
softerror,
failuretolerance,
triple modular redundancy,
duplication,
reliability
Supporting agencies: The work was carried out within the framework of the state assignment No. 0063-2019-0010.
About the Authors
A. A. Zatsarinny
Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences
Russian Federation
Russian Federation
44-2 Vavilova Str., Moscow 119333
Alexandеr A. Zatsarinny — Dr. Sci. (Eng.), Chief Researcher, Deputy Director
Yu. A. Stepchenkov
Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences
Russian Federation
Russian Federation
44-2 Vavilova Str., Moscow 119333
Yury A. Stepchenkov — Cand. Sci. (Eng.), Department Head
Yu. G. Diachenko
Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences
Russian Federation
Russian Federation
44-2 Vavilova Str., Moscow 119333
Yury G. Diachenko — Cand. Sci. (Eng.), Senior Researcher
Yu. V. Rogdestvenski
Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences
Russian Federation
Russian Federation
44-2 Vavilova Str., Moscow 119333
Yury V. Rogdestvenski — Cand. Sci. (Eng.), Leading Researcher
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Review
For citations:
Zatsarinny A.A., Stepchenkov Yu.A., Diachenko Yu.G., Rogdestvenski Yu.V. Failure-tolerant synchronous and self-timed circuits comparison. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2021;24(4):229-233. (In Russ.) https://doi.org/10.17073/1609-3577-2021-4-229-233
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