For citations:
Kuznetsov V.A., Protasov D.Yu., Dmitriev D.V., Kostyuchenko V.Ya., Rogilo D.I., Zhuravlev K.S. Parameters of ohmic contacts and consideration of the influence of actual sample sizes on the field dependence of the drift velocity in In0.16Ga0.84As layers. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2025;28(1):44-54. (In Russ.) https://doi.org/10.17073/1609-3577j.met202407.602
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