For citations:
Vanyukhin K.D., Zakharchenko R.V., Kargin N.I., Pashcov M.V., Seidman L.A. RESEARCH OF STRUCTURE AND SURFACE MORPHOLOGY OF TWO–LAYER CONTACT TI/AL METALLIZATION. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2013;(3):60-65. (In Russ.) https://doi.org/10.17073/1609-3577-2013-3-60-65
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