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Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering

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Gurevich V.S., Gaponov V.E., Redkorechev V.I., Zakharov Y.N. HOLOGRAPHIC MEASUREMENT OF SURFACE ACOUSTIC WAVE CHARACTERISTICS IN CRYSTALS. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2012;(1):26-32. (In Russ.) https://doi.org/10.17073/1609-3577-2012-1-26-32



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ISSN 1609-3577 (Print)
ISSN 2413-6387 (Online)