For citations:
Abgaryan K.K., Bazhanov D.I., Mutigullin I.V. Theoretical Investigation of Electronic and Structural Properties of AlN Thin Films. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2015;18(1):48-51. (In Russ.) https://doi.org/10.17073/1609-3577-2015-1-48-51
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