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Control of Yellow Photoluminescence in AlGaN/GaN Heterostructures

https://doi.org/10.17073/1609-3577-2015-2-146-148

Abstract

Photoluminescence with the peak corresponding to yellow light in the visible spectrum (the so−called yellow luminescence) is generated by deep levels in the buffer GaN layer of the ehterostructures and depeonds on heterostructure growth conditions. In turn, the deep levels affect the resistivity of the ohimic contacts of RF transistors based on these heterostructures. This determines the reliability of GaN HF transistor operation. Two types of instruments have been developed for controlling photoluminescence with the peak in the yellow spectral region for characterizing the quality of AlGaN/GaN/SiC and AlGaN/GaN/Al2O3 heterostructures. One of them provides for rapid control of yellow photoluminescence and the other allows mapping of photoluminescence across the heterostructure area. Examples of photoluminescence maps for experimental structures grown on different substrates have been given.

About the Authors

N. B. Gladysheva
JSC «S&PE «Pulsar»
Russian Federation

Cand. Sci (Econ.), Professor, Director General,

27 Okruzhnoi proezd, Moscow 105187



V. V. Gruzdov
JSC «S&PE «Pulsar»
Russian Federation

Cand. Sci (Econ.), Professor, Director General,

27 Okruzhnoi proezd, Moscow 105187



M. E. Gusev
JSC «S&PE «Pulsar»
Russian Federation

electronics engineer,

27 Okruzhnoi proezd, Moscow 105187



Yu. V. Kolkovskii
JSC «S&PE «Pulsar»; Moscow Technological University (MIREA)
Russian Federation

Dr. Sci. (Eng.), Professor, Deputy Director General for Research,

27 Okruzhnoi proezd, Moscow 105187,

78 Vernadsky Ave., Moscow 119454



Yu. A. Kontsevoi
JSC «S&PE «Pulsar»; Moscow Technological University (MIREA)
Russian Federation

Dr. Sci. (Eng.), Professor,

27 Okruzhnoi proezd, Moscow 105187,

78 Vernadsky Ave., Moscow 119454



E. F. Pevtsov
Moscow Technological University (MIREA)
Russian Federation

Cand. Sci. (Eng.), Associate Professor,

78 Vernadsky Ave., Moscow 119454



References

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2. Kikkawa T., Makiyama K., Ohki T., Kanamura M., Imanishi K., Hara N., Joshin K. High performance and high reliability AlGaN/ GaN HEMTs. Phys. Status Solidi (a). 2009, vol. 206, no. 6, pp. 1135—1144. DOI: 10.1002/pssa.200880983

3. Jessen G. H., White B. D., Bradley S. T., Smith P. E., Brillson L. J., van Nostrand J. E., Fitch R., Via G. D., Gillespie J. K.,. Dettmer R. W, Sewell J. S. Ohmic contact characterization of AlGaN/GaN device layers with spatially localized LEEN spectroscopy. Solid−State Electronics. 2002, vol. 46, no. 9, pp. 1427—1431. DOI: 10.1016/S0038−1101(02)00075−8.


Review

For citations:


Gladysheva N.B., Gruzdov V.V., Gusev M.E., Kolkovskii Yu.V., Kontsevoi Yu.A., Pevtsov E.F. Control of Yellow Photoluminescence in AlGaN/GaN Heterostructures. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2015;18(2):146-148. (In Russ.) https://doi.org/10.17073/1609-3577-2015-2-146-148

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ISSN 1609-3577 (Print)
ISSN 2413-6387 (Online)