For citations:

Kuzmenko A.P., Timakov D.I. STRESS TOPOLOGY WITHIN SILICON SINGLE-CRYSTAL CANTILEVER BEAM. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2014;(1):53-57. (In Russ.) https://doi.org/10.17073/1609-3577-2014-1-53-57