For citations:
Anfimov I.M., Kobeleva S.P., Pylnev A.V., Schemerov I.V., Egorov D.S., Yurchuk S.V. Free carrier recombination lifetime calculation from photoconductivity decay measurement in non-passivated silicon. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2016;19(3):210-216. (In Russ.) https://doi.org/10.17073/1609-3577-2016-3-210-216