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Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering

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Anfimov I.M., Kobeleva S.P., Pylnev A.V., Schemerov I.V., Egorov D.S., Yurchuk S.V. Free carrier recombination lifetime calculation from photoconductivity decay measurement in non-passivated silicon. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2016;19(3):210-216. (In Russ.) https://doi.org/10.17073/1609-3577-2016-3-210-216



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ISSN 1609-3577 (Print)
ISSN 2413-6387 (Online)