For citations:
Adarchin S.A., Kosushki V.G., Gurin V.M., Kozhitov L.V., Vasyutin M.S., Bybenin V.G. Stresses modeling in multilayer semiconductor structures of automobile regulators and predicting the reliability of their operation. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2020;23(2):134-141. (In Russ.) https://doi.org/10.17073/1609-3577-2020-2-134-141
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