For citations:
Yugova T.G., Belov A.G., Kanevskii V.E., Kladova E.I., Knyazev S.N., Parfent'eva I.B. Comparison between optical and electrophysical data on free electron concentration in n-InAs samples. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2021;24(3):153-161. (In Russ.) https://doi.org/10.17073/1609-3577-2021-3-153-161
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