For citations:

Manyakhin F.I. CHARGE RELAXATION BASED INTEGRAL–DIFFERENTIAL METHOD OF SEMICONDUCTOR ENERGY LEVEL TEMPERATURE SPECTROSCOPY. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2013;(4):58-62. (In Russ.) https://doi.org/10.17073/1609-3577-2013-4-58-62