For citations:
Bolotov V.V., Nesov S.N., Korusenko P.M., Povoroznyuk S.N. XPS PHASE COMPOSITION STUDY OF por−Si/SnOx NANOCOMPOSITE SAMPLES EXPOSED TO THERMAL OXIDATION. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2012;(1):57-61. (In Russ.) https://doi.org/10.17073/1609-3577-2012-1-57-61
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