For citations:
Abgarian K.K., Mutigullin I.V., Uvarov S.I., Uvarova O.V. Multiscale modeling of clusters of point defects in semiconductor structures. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2018;21(4):199-206. (In Russ.) https://doi.org/10.17073/1609-3577-2018-4-199-206