For citations:
Lutzau A.V., Krymko M.M., Enisherlova K.L., Temper E.M., Razguliaev I.I. Heterostructure Investigation Using X–ray Single–Crystal Diffractometry Method. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2012;(3):72-78. (In Russ.) https://doi.org/10.17073/1609-3577-2012-3-72-78
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