For citations:

Bytkin S.V., Kritskaya T.V., Kobeleva S.P. STATISTICAL ANALYSIS OF GE INFLUENCE ON RADIATION AND THERMAL STABILITY OF THE ELECTROPHYSICAL CHARACTERISTICS OF CZ–SI

BASED DEVICE N—P—N—P–STRUCTURES. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2013;(4):42-48. (In Russ.) https://doi.org/10.17073/1609-3577-2013-4-42-48