For citations:
Golubiatnikov V.A., Grigor’ev F.I., Lysenko A.P., Strogankova N.I., Shadov M.B., Belov A.G., Kanevsky V.E. THE METHOD OF SEPARATE DETERMINATION OF HIGH−OHMIC SAMPLE RESISTANCE AND CONTACT RESISTANCE. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2013;(4):63-66. (In Russ.) https://doi.org/10.17073/1609-3577-2013-4-63-66
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