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Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering

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The Journal Materials of Electronics Engineering has been published since 1998 in Russian, contains new articles and reviews and is one of the major scientific journals in physics, materials science and the development of science consuming mirco- and nanoelectronics technologies.  Its pages always provide scientific results and topical reviews of leading scientific schools of Russia and other states.

Members of its Editorial Board are Russia’s leading experts in respective fields and leading foreign scientists. This provides for a high level and sufficient objectiveness in the selection of published works on physical and chemical issues of advanced materials science. All the articles pass careful examination and then approved for publication at Editorial Board meetings.

At a decision of the Higher Attestation Committee of the Ministry of Education of the Russian Federation (http://vak.ed.gov.ru/87), the magazine has been included into the List of periodical and Scientific Publications issued in the Russian Federation that are recommended for publishing the main results of Dr.Sci. theses.

The journal is included into the full-text database eLibrary.ru (http://elibrary.ru/title_about.asp?id=7815), the Russian Index of Scientific References, the Reference Journal and the VINITI Database. Since 2013 the articles published in the magazine receive DOI.

Part of the articles published in the journal are translated in English by Pleiades Publishing, Ltd. and published on an annual basis in Russian Microelectronics, No. 8 (http://www.maik.ru/contents/micelec/micelec8_14v43cont.htm).

Russian Microelectronics is abstracted and/or indexed in SCOPUS, INSPEC, Chemical Abstracts Service (CAS), Google Scholar, EBSCO, Academic OneFile, Academic Search, CSA Environmental Sciences, Current Contents Collections / Electronics & Telecommunications Collection, EI-Compendex, Gale, INIS Atomindex, OCLC, SCImago, Summon by ProQuest, Thomson Reuters (ISI).

The Journal “Izvestiya vuzov. Materialy elektronnoi tekhniki” ("Materials of Electronics Engineering") is registered in Federal Service for Supervision in the Sphere of Mass Communications (PI number FS 77-59522 of 10.23.2014), the previous certificate number 016108 from 15.05.1997.

 

Index in catalogues Russian Press (http://www.pressa-rf.ru/cat/1/edition/y_e47215/) and UralPress: 47215 (http://www.ural-press.ru/catalog/).

Current issue

Vol 28, No 3 (2025)

MATERIALS SCIENCE AND TECHNOLOGY. SEMICONDUCTORS

MODELING OF PROCESSES AND MATERIALS

PHYSICAL CHARACTERISTICS AND THEIR STUDY

112
Abstract

In2O3:Er films have been synthesized on silicon substrates by RF magnetron sputter deposition. The solid solution ((In1-xErx)2O3) is formed here. The 1.534 mkm erbium electroluminescence is observed by the forward current through the investigated hetero-structure: substrate-n-Si\In2O3:Er-film\ITO-contact. The Er excitation model by the electron-hole recombination is proposed. The model consist of the electrons at the indium oxide conduction band. And the hole current is through the channel at the middle of the In2O3:Er band gap. The hole channel is formed by the defect state density spreading from the valence band edge into the band gap. Therefore the electron-hole recombination energy is lower then the indium oxide band gap and equals to the 1.56 eV. Then the electron-hole recombination excites in resonance the third excited state of Er3+ 4I9/2 (1.53 эВ). Then the non-radiative relaxation to the first excited state 4I13/2 (0.81 эВ) occurs. And finally the 1.534 mkm radiative emission into ground state 4I15/2 occurs.

64
Abstract

Aluminum and its alloys are one of the most used materials in the production of technical products: from electrical wires to aircraft. The development of new aluminum alloys and the constant expansion of the field of their application leads to the need to develop a unified approach to the theoretical description of the physical properties of systems with a different number of components and to determine the influence of metals on the characteristics of the alloy. For the study of thermal behavior of aluminum alloys, binary systems are the most suitable due to the small variability of their compositions. Such alloys are, in particular, antifriction self-lubricating two-component alloys of Al-Sn and Al-Zn systems. In addition, due to the existence of the effect of inheritance by the alloy of a number of characteristic features of components, there is a need to calculate the thermophysical properties of Al, Sn and Zn. In this connection, we approximated the experimental data arrays on the temperature dependences of thermal-physical properties of Al, Sn and Zn using the functions obtained within the framework of the author's quasi-two-phase model of the local-equilibrium region. The features on the obtained graphs in the form of finite jumps, peaks and pits with rounded tops are associated with structural transformations or phase transitions. It is suggested that in the temperature range of 100-200 K there are pits in the temperature dependences of thermal conductivities of aluminum and zinc formed due to structural transformations in these metals or due to the occurrence of structural inhomogeneity in them during crystallization. Predictive estimates of heat capacities of Al60Sn40 and Al95Zn5 alloys obtained using the mixing rule (in chemistry ‒ the rule of obtaining a compound of a given composition) have been carried out.

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