For citations:
Vaskou O.S., Niss V.S., Kononenko V.K., Turtsevich A.S., Rubtsevich I.I., Solov’ev Y.A., Kerentsev A.F. DIAGNOSTICS OF TECHNOLOGICAL CHARACTERISTICS OF HIGH–POWER TRANSISTORS USING RELAXING IMPEDANCE SPECTROMETRY OF THERMAL PROCESSES. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2014;(1):47-52. (In Russ.) https://doi.org/10.17073/1609-3577-2014-1-47-52
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