For citations:

Tapero K.I., Petrov A.S., Ulimov V.N. RADIATION INDUCED DEGRADATION OF CMOS OPERATIONAL AMPLIFIERS AT DIFFERENT DOSE RATES AND TEMPERATURES. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2015;18(4):291-296. (In Russ.) https://doi.org/10.17073/1609-3577-2015-4-291-296