For citations:
Turishchev S.Yu., Parinova E.V., Koyuda D.A., Spirin D.E., Nesterov D.N., Romantsov R.V., Fedotovа J.A., Streltsov E.A., Malashchonak M.V., Fedotov A.K. MICROSCOPIC AND X–RAY SPECTROSCOPIC STUDY OF NI ROD MASSIVES IN SILICON DIOXIDE MATRIX. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2016;19(1):50-58. (In Russ.) https://doi.org/10.17073/1609-3577-2016-1-50-58