Advanced Materials for Acoustoelectronics
https://doi.org/10.17073/1609-3577-2012-3-25-28
Abstract
Multicomponent piezoelectric crystals of langasite family were studied. The process of crystal growth and crystal structure were investigated. X−ray diffraction and topography were used to study the acoustic properties of crystals. The possibility of application of the piezoelectric crystals in high−temperature SAW−sensors was demonstrated.
About the Authors
D. V. Roshchupkin
Institute of Microelectronics Technology and High–Purity Materials, Russian Academy of Sciences
Russian Federation
Russian Federation
D. V. Irzhak
Institute of Microelectronics Technology and High–Purity Materials, Russian Academy of Sciences
Russian Federation
Russian Federation
E. V. Emelin
Institute of Microelectronics Technology and High–Purity Materials, Russian Academy of Sciences
Russian Federation
Russian Federation
R. R. Fahrtdinov
FOMOS Materials Co.
Russian Federation
Russian Federation
O. A. Buzanov
FOMOS Materials Co.
Russian Federation
Russian Federation
S. A. Sakharov
FOMOS Materials Co.
Russian Federation
Russian Federation
References
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Review
For citations:
Roshchupkin D.V., Irzhak D.V., Emelin E.V., Fahrtdinov R.R., Buzanov O.A., Sakharov S.A. Advanced Materials for Acoustoelectronics. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2012;(3):25-28. (In Russ.) https://doi.org/10.17073/1609-3577-2012-3-25-28
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