For citations:
Zatsarinny A.A., Stepchenkov Yu.A., Diachenko Yu.G., Rogdestvenski Yu.V. Failure-tolerant synchronous and self-timed circuits comparison. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2021;24(4):229-233. (In Russ.) https://doi.org/10.17073/1609-3577-2021-4-229-233
Email this article 