For citations:
Knyazev S.N., Kudrya A.V., Komarovskiy N.Yu., Parkhomenko Yu.N., Molodtsova E.V., Yushchuk V.V. Methods of dislocation structure characterization in AIIIBV semiconductor single crystals. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2022;25(4):323-336. (In Russ.) https://doi.org/10.17073/1609-3577-2022-4-323-336. EDN: TEZNPS