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Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering

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Knyazev S.N., Kudrya A.V., Komarovskiy N.Yu., Parkhomenko Yu.N., Molodtsova E.V., Yushchuk V.V. Methods of dislocation structure characterization in AIIIBV semiconductor single crystals. Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 2022;25(4):323-336. (In Russ.) https://doi.org/10.17073/1609-3577-2022-4-323-336. EDN: TEZNPS



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ISSN 1609-3577 (Print)
ISSN 2413-6387 (Online)